半导体芯片老化和逻辑测试系统
发布时间: 2023-03-10 11:13
生产厂家:Aehr Test Systems
从工艺到生产的解决方案:
FOX-CP Single Wafer Stepping Test & Burn-In System
FOX-NP Dual WaferPak & Dual DiePak Test & Burn-In System
FOX-XP Multi WaferPak & Multi DiePak Test & Burn-In System
FOX-P WaferPak Contactors
FOX-P DiePak Carrier